Based upon the Dimension Icon AFM architecture, the FastScan AFM is a tip-scanning system that provides measurements on both large and small size samples in air or fluids.
Bruker said the Dimension FastScan enables users to work faster than is possible with other commercial AFM systems, delivering results in seconds or minutes instead of hours or days.
Bruker Nano Surfaces Division president Mark Munch said Dimension FastScan realizes one of Bruker’s goals for AFM technology, which is to enable customers to be more productive without losing resolution or flexibility.
"With over thirty-eight patents fueling its breakthroughs, FastScan provides researchers the unique ability to use atomic force microscopy for new applications requiring higher scanning speeds that previously just were not available on a research-grade AFM," Munch said.
Bruker AFM Business VP and GM David Rossi said their new FastScan, in conjunction with other recent Bruker AFM technological breakthroughs, such as ScanAsyst and PeakForce QNM, delivers significant improvements in productivity as well as enabling techniques that provide new quantitative information at the nanoscale, and that make AFMs easier to use by academia and industry alike.
